Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets. - Reza Ramezani; Juan Antonio Clemente; Francisco J. Franco (Reliab. Eng. Syst. Saf., 2020)

Thermal Neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under Different Incident Angles. - Juan Carlos Fabero; Golnaz Korkian; Francisco J. Franco; Hortensia Mecha; Manon Letiche; Juan Antonio Clemente (LATS, 2021)

Impact of DVS on Power Consumption and SEE Sensitivity of COTS Volatile SRAMs. - Mohammadreza Rezaei; Francisco J. Franco; Juan Carlos Fabero; Hortensia Mecha; Helmut Puchner; Juan Antonio Clemente (LATS, 2021)

Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories. - Golnaz Korkian; Daniel León; Francisco J. Franco; Juan Carlos Fabero; Manon Letiche; Yolanda Morilla; Pedro Martín-Holgado; Helmut Puchner; Hortensia Mecha; Juan Antonio Clemente (IEEE Access, 2022)

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles. - Juan Carlos Fabero; Golnaz Korkian; Francisco J. Franco; Guillaume Hubert; Hortensia Mecha; Manon Letiche; Juan Antonio Clemente (Microprocess. Microsystems, 2023)