Simulation of state of the art EEPROM programming window closure during endurance degradation. - Franck Matteo; Roberto Simola; Franck Melul; Karine Coulié; Jérémy Postel-Pellerin; Arnaud Régnier (DTIS, 2021)

Hot Electron Source Side Injection Comprehension in 40nm eSTM™. - Franck Melul; Thibault Kempf; Vincenzo Della Marca; Marc Bocquet; Madjid Akbal; Frederique Trenteseaux; Marc Mantelli; Arnaud Régnier; Stephan Niel; Francesco La Rosa (IMW, 2021)