An LSSD Pseudo Random Pattern Test System. - Franco Motika; John A. Waicukauski; Edward B. Eichelberger; Eric Lindbloom (ITC, 1983)

Application and Analysis of IDDQ Diagnostic Software. - Phil Nigh; Donato O. Forlenza; Franco Motika (ITC, 1997)

Diagnosis and characterization of timing-related defects by time-dependent light emission. - Daniel R. Knebel; Pia N. Sanda; Moyra K. McManus; Jeffrey A. Kash; James C. Tsang; David P. Vallett; Leendert M. Huisman; Phil Nigh; Rick Rizzolo; Peilin Song; Franco Motika (ITC, 1998)

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. - Phil Nigh; David P. Vallett; Atul Patel; Jason Wright; Franco Motika; Donato O. Forlenza; Ray Kurtulik; Wendy Chong (ITC, 1999)

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor. - Peilin Song; Franco Motika; Daniel R. Knebel; Rick Rizzolo; Mary P. Kusko; Julie Lee; Moyra K. McManus (ITC, 1999)

S/390 G5 CMOS microprocessor diagnostics. - Peilin Song; Franco Motika; Daniel R. Knebel; Richard F. Rizzolo; Mary P. Kusko (IBM J. Res. Dev., 1999)

Structural and functional test of IBM System z10 chips. - Gerard Salem; D. W. Wittig; Thomas G. Foote; Bryan J. Robbins; C. Hirko; Donato O. Forlenza; Franco Motika; J. A. Kyle; Mary P. Kusko; Orazio P. Forlenza; R. J. Frishmuth; Rona Yaari; et al. (IBM J. Res. Dev., 2009)