Tools for contactless testing and simulation of CMOS circuits. - Franco Stellari; Franco Zappa; Sergio Cova; L. Vendrame (Microelectron. Reliab., 2001)

Optical diagnosis of excess IDDQ in low power CMOS circuits. - Franco Stellari; Peilin Song; James C. Tsang; Moyra K. McManus; Mark B. Ketchen (Microelectron. Reliab., 2002)

Optical and Electrical Testing of Latchup in I/O Interface Circuits. - Franco Stellari; Peilin Song; Moyra K. McManus; Robert Gauthier 002; Alan J. Weger; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda (ITC, 2003)

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. - Romain Desplats; A. Eral; Felix Beaudoin; Philippe Perdu; Alan J. Weger; Moyra K. McManus; Peilin Song; Franco Stellari (Microelectron. Reliab., 2003)

Latchup Analysis Using Emission Microscopy. - Franco Stellari; Peilin Song; Moyra K. McManus; Alan J. Weger; Robert Gauthier 002; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda; Philip Wu; Steven C. Wilson (Microelectron. Reliab., 2003)

Backside Flip-Chip testing by means of high-bandwidth luminescence detection. - Alberto Tosi; Franco Stellari; Franco Zappa; Sergio Cova (Microelectron. Reliab., 2003)

A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. - Peilin Song; Franco Stellari; Alan J. Weger; Tian Xia (ITC, 2004)

Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD). - Franco Stellari; Peilin Song (Microelectron. Reliab., 2004)

Current crowding in faulty MOSFET: optical and electrical investigation. - Alberto Tosi; Franco Stellari; Franco Zappa (Microelectron. Reliab., 2004)

CMOS circuit testing via time-resolved luminescence measurements and simulations. - Franco Stellari; Alberto Tosi; Franco Zappa; Sergio Cova (IEEE Trans. Instrum. Meas., 2004)

An advanced optical diagnostic technique of IBM z990 eServer microprocessor. - Peilin Song; Franco Stellari; Bill Huott; Otto Wagner; Uma Srinivasan 002; Yuen H. Chan; Rick Rizzolo; H. J. Nam; James P. Eckhardt; Timothy G. McNamara; Ching-Lung Tong; Alan J. Weger; et al. (ITC, 2005)

Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). - Franco Stellari; Peilin Song; John Hryckowian; Otto A. Torreiter; Steven C. Wilson; Philip Wu; Alberto Tosi (Microelectron. Reliab., 2005)

Innovative packaging technique for backside optical testing of wire-bonded chips. - Alberto Tosi; Franco Stellari; Franco Zappa (Microelectron. Reliab., 2005)

High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. - Franco Stellari; Peilin Song; Tim Diemoz; Alan J. Weger; Tami Vogel; Steven C. Wilson; John Pennings; Richard F. Rizzolo (ITC, 2006)

A high sensitivity process variation sensor utilizing sub-threshold operation. - Mesut Meterelliyoz; Peilin Song; Franco Stellari; Jaydeep P. Kulkarni; Kaushik Roy 001 (CICC, 2008)

Optical Diagnostics for IBM POWER6- Microprocessor. - Peilin Song; Stephen Ippolito; Franco Stellari; John Sylvestri; Tim Diemoz; George Smith; Paul Muench; Norm James; Seongwon Kim; Hector Saenz (ITC, 2008)

On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). - Franco Stellari; Peilin Song; John Sylvestri; D. Miles; Orazio P. Forlenza; Donato O. Forlenza (ITC, 2009)

Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. - Mesut Meterelliyoz; Peilin Song; Franco Stellari; Jaydeep P. Kulkarni; Kaushik Roy 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2010)

MARVEL - Malicious alteration recognition and verification by emission of light. - Peilin Song; Franco Stellari; Dirk Pfeiffer; Jim Culp; Alan J. Weger; Alyssa Bonnoit; Bob Wisnieff; Marc Taubenblatt (HOST, 2011)

Root cause identification of an hard-to-find on-chip power supply coupling fail. - Franco Stellari; Thomas Cowell; Peilin Song; Michael Sorna; Zeynep Toprak Deniz; John F. Bulzacchelli; Nandita A. Mitra (ITC, 2012)

Tester-based optical and electrical diagnostic system and techniques. - Peilin Song; Franco Stellari (VTS, 2012)

Verification of untrusted chips using trusted layout and emission measurements. - Franco Stellari; Peilin Song; Alan J. Weger; Jim Culp; A. Herbert; Dirk Pfeiffer (HOST, 2014)

Counterfeit IC detection using light emission. - Peilin Song; Franco Stellari; Alan J. Weger (ITC, 2014)

Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements. - Franco Stellari; Peilin Song; Herschel A. Ainspan (VTS, 2014)

Time-integrated photon emission as a function of temperature in 32 nm CMOS. - Andrea Bahgat Shehata; Alan J. Weger; Franco Stellari; Peilin Song; Hervé Deslandes; Ted R. Lundquist; Euan Ramsay (IRPS, 2015)

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. - Franco Stellari; Keith A. Jenkins; Alan J. Weger; Barry P. Linder; Peilin Song (IRPS, 2015)

Revealing SRAM memory content using spontaneous photon emission. - Franco Stellari; Peilin Song; Manuel Villalobos; John Sylvestri (VTS, 2016)

Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress. - Franco Stellari; Naigang Wang; Peilin Song (ESSDERC, 2018)

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. - Franco Stellari; Alan J. Weger; Keith A. Jenkins; Giuseppe La Rosa; Barry P. Linder; Peilin Song (IRPS, 2018)

Case Study of Advanced Diagnostic Techniques for Multi Port Register File. - Uma Srinivasan 002; William V. Huott; Chad Adams; Pete Freiburger; Franco Stellari; Peilin Song; Phong Tran; Dave Albert (NATW, 2019)

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. - Alfred L. Crouch; Peter L. Levin; Jennifer Dworak; Lakshmi Ramakrishnan; Yuhe Xia; Chi Zhang; Daniel Engels; Gary Evans; Ping Gui; Scott McWilliams; Saurabh Gupta 005; Franco Stellari; et al. (VTS, 2019)

Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking. - Benjamin Tan 001; Ramesh Karri; Nimisha Limaye; Abhrajit Sengupta; Ozgur Sinanoglu; Md. Moshiur Rahman 001; Swarup Bhunia; Danielle Duvalsaint; Ronald D. Blanton; Amin Rezaei 001; Yuanqi Shen; Hai Zhou 001; et al. (CoRR, 2020)

Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation. - Franco Stellari; Ernest Y. Wu; Martin M. Frank; Leonidas E. Ocala; Takashi Ando; Peilin Song (ESSDERC, 2022)

Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security. - Franco Stellari; Peilin Song (ITC, 2022)