Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. - Francesca Danesin; Franco Zanon; Simone Gerardin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Alessandro Paccagnella (Microelectron. Reliab., 2006)

Thermal storage effects on AlGaN/GaN HEMT. - Francesca Danesin; Augusto Tazzoli; Franco Zanon; Gaudenzio Meneghesso; Enrico Zanoni; Antonio Cetronio; Claudio Lanzieri; Simone Lavanga; Marco Peroni; Paolo Romanini (Microelectron. Reliab., 2008)

Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. - Augusto Tazzoli; Gaudenzio Meneghesso; Franco Zanon; Francesca Danesin; Enrico Zanoni; Philippe Bove; R. Langer; J. Thorpe (Microelectron. Reliab., 2008)

Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. - Nicolo Ronchi; Franco Zanon; Antonio Stocco; Augusto Tazzoli; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2009)

Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. - Abdellatif Bey-Temsamani; S. Kauffmann; Y. Descas; Bart Vandevelde; Franco Zanon; Geert Willems (Microelectron. Reliab., 2017)

Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components. - Bart Vandevelde; Filip Vanhee; Davy Pissoort; Lieven Degrendele; Johan de Baets; Bart Allaert; Ralph Lauwaert; Franco Zanon; Riet Labie; Geert Willems (Microelectron. Reliab., 2017)