High temperature reliability of μtrench Phase-Change Memory devices. - Gabriele Navarro; Sarra Souiki; Alain Persico; Veronique Sousa; Jean-François Nodin; Carine Jahan; François Aussenac; Vincent Delaye; Olga Cueto; Luca Perniola; Barbara De Salvo (Microelectron. Reliab., 2012)

Interplay between charge trapping and polarization switching in MFDM stacks evidenced by frequency-dependent measurements. - Justine Barbot; Jean Coignus; Nicolas Vaxelaire; Catherine Carabasse; Olivier Glorieux; Messaoud Bedjaoui; François Aussenac; François Andrieu; François Triozon; Laurent Grenouillet (ESSCIRC, 2022)

Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement. - Camille Laguna; Mathieu Bernard; Julien Garrione; Niccolo Castellani; Valentina Meli; S. Martin; François Aussenac; D. Rouchon; N. Rochat; Emmanuel Nolot; Guillaume Bourgeois; Marie Claire Cyrille; et al. (ESSDERC, 2022)