ELF-Murphy Data on Defects and Test Sets. - Edward J. McCluskey; Ahmad A. Al-Yamani; Chien-Mo James Li; Chao-Wen Tseng; Erik H. Volkerink; François-Fabien Ferhani; Edward Li; Subhasish Mitra (VTS, 2004)

Classifying Bad Chips and Ordering Test Sets. - François-Fabien Ferhani; Edward J. McCluskey (ITC, 2006)

How Many Test Patterns are Useless? - François-Fabien Ferhani; Nirmal R. Saxena; Edward J. McCluskey; Phil Nigh (VTS, 2008)