An Automated Laser Prober to Determine VLSI Internal Node Logic States. - Francois J. Henley (ITC, 1984)

Contactless VLSI Laser Probing. - Uming Ko; Dinesh G. Patel; Francois J. Henley (ITC, 1985)

Tests of Hermetically Sealed LSI/VLSI Devices by Laser Photoexcitation Logic Analysis. - Francois J. Henley (ITC, 1986)

Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics for a Gigahertz Production Test System. - Francois J. Henley; Hee-June Choi (ITC, 1988)

High-Speed Pattern Generator and GaAs Pin : Electronics for a Gigahertz Production Test System. - Dean J. Kratzer; Steve Barton; Francois J. Henley; David A. Plomgrem (ITC, 1988)

An ultra high speed test system. - Francois J. Henley (IEEE Des. Test, 1989)