Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode. - Vincent Huard; Francois Jacquet; Souhir Mhira; Lionel Jure; Olivier Montfort; Mathieu Louvat; L. Zaia; F. Bertrand; E. Acacia; O. Caffin; H. Belhadj; O. Durand; et al. (IRPS, 2022)

Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation. - Shotaro Sugitani; Ryuichi Nakajima; Takafumi Ito; Jun Furuta; Kazutoshi Kobayashi; Mathieu Louvat; Francois Jacquet; Jean-Christophe Eloy; Olivier Montfort; Lionel Jure; Vincent Huard (IOLTS, 2023)

Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies. - Ryuichi Nakajima; Takafumi Ito; Shotaro Sugitani; Tomoya Kii; Mitsunori Ebara; Jun Furuta; Kazutoshi Kobayashi; Mathieu Louvat; Francois Jacquet; Jean-Christophe Eloy; Olivier Montfort; Lionel Jure; et al. (IEICE Trans. Electron., 2024)