Low-cost phase noise testing of complex RF ICs using standard digital ATE. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (ITC, 2014)

Phase noise measurement on IF analog signals using standard digital ATE resources. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (NEWCAS, 2014)

Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (DDECS, 2015)

A new technique for low-cost phase noise production testing from 1-bit signal acquisition. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (ETS, 2015)

A digital technique for the evaluation of SSB phase noise of analog/RF signals. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (LATS, 2015)

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (J. Electron. Test., 2015)

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (J. Electron. Test., 2016)

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (J. Circuits Syst. Comput., 2016)

Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. - T. Vayssade; Florence Azaïs; Laurent Latorre; Francois Lefevre (IOLTS, 2018)

Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. - T. Vayssade; Florence Azaïs; Laurent Latorre; Francois Lefevre (ETS, 2019)

Use of ensemble methods for indirect test of RF circuits: can it bring benefits? - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (LATS, 2019)

Which metrics to use for RF indirect test strategy? - Hassan El Badawi; Mariane Comte; Florence Azaïs; Vincent Kerzèrho; Serge Bernard; François Lefevre (SMACD, 2019)

EVM measurement of RF ZigBee transceivers using standard digital ATE. - T. Vayssade; Florence Azaïs; Laurent Latorre; François Lefevre (DFT, 2020)

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. - Florence Azaïs; Serge Bernard; Mariane Comte; Bastien Deveautour; Sophie Dupuis; Hassan El Badawi; Marie-Lise Flottes; Patrick Girard 001; Vincent Kerzèrho; Laurent Latorre; François Lefèvre; Bruno Rouzeyre; et al. (IOLTS, 2020)

Implementing indirect test of RF circuits without compromising test quality: a practical case study. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzèrho; Francois Lefevre; I. Gorenflot (LATS, 2020)

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2020)

Digital test of ZigBee transmitters: Validation in industrial test environment. - Thibault Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre (DATE, 2021)

Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. - Thibault Vayssade; Mouhamad Chehaitly; Florence Azaïs; Laurent Latorre; François Lefèvre (ETS, 2021)

Exploring on-line RF performance monitoring based on the indirect test strategy. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzèrho; François Lefèvre (LATS, 2021)

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2021)

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. - T. Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". - Thibault Vayssade; Florence Azaïs; Laurent Latorre; François Lefèvre (LATS, 2023)

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. - Hassan El Badawi; Florence Azaïs; Serge Bernard; Mariane Comte; Vincent Kerzerho; Francois Lefevre (J. Electron. Test., 2023)

Low-cost generation of RF test stimuli from baseband digital signals. - Kamilia Tahraoui; T. Vayssade; François Lefèvre; Laurent Latorre; Florence Azaïs (ATS, 2024)

Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation Scheme. - Kamilia Tahraoui; R. Burelle; T. Vayssade; François Lefevre; Laurent Latorre; Florence Azaïs (DFT, 2024)

Digital generation of single tone FM/PM test stimuli: a theoretical analysis. - Kamilia Tahraoui; T. Vayssade; François Lefèvre; Laurent Latorre; Florence Azaïs (LATS, 2024)

Digital-Based Solution for the Generation of FM/PM Test Stimuli. - Kamilia Tahraoui; Thibault Vayssade; François Lefevre; Laurent Latorre; Florence Azaïs (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)