Stress induced leakage current at low field in ultra thin oxides. - François Lime; Gérard Ghibaudo; G. Guégan (Microelectron. Reliab., 2001)

Charge trapping in SiO2/HfO2/TiN gate stack. - François Lime; Gérard Ghibaudo; B. Guillaumot (Microelectron. Reliab., 2003)

Finite elements study of high mechanical stress in nanostructures for innovative NEMS sensors. - Xin Xu; Bogdan Bercu; François Lime; Laurent Montès (NEMS, 2009)

A complete and Verilog-A compatible Gate-All-Around long-channel junctionless MOSFET model implemented in CMOS inverters. - Oana Moldovan; François Lime; Benjamín Iñíguez (Microelectron. J., 2015)

Modeling approach for rapid NEGF-based simulation of ballistic current in ultra-short DG MOSFETs. - Fabian Hosenfeld; Michael Graef; Fabian Horst; Alexander Kloes; Benjamín Iñíguez; François Lime (MIXDES, 2016)

Non-iterative NEGF based model for band-to-band tunneling current in DG TFETs. - Fabian Hosenfeld; Fabian Horst; Alexander Kloes; Benjamín Iñíguez; François Lime (MIXDES, 2017)

Evaluation of Static/Transient Performance of TFET Inverter Regarding Device Parameters Using a Compact Model. - Atieh Farokhnejad; Fabian Horst; Benjamín Iñíguez; François Lime; Alexander Kloes (ESSDERC, 2019)