Genetic algorithm optimisation for evanescent mode waveguide filter design. - Marc Lecouve; Pierre Jarry; Eric Kerherve; Nicolas Boutheiller; François Marc (ISCAS, 2000)

Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language. - B. Mongellaz; François Marc; Noëlle Milet-Lewis; Yves Danto (Microelectron. Reliab., 2002)

Reliability simulation of electronic circuits with VHDL-AMS. - François Marc; B. Mongellaz; Yves Danto (FDL, 2003)

Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study. - B. Mongellaz; François Marc; Yves Danto (Microelectron. Reliab., 2003)

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. - Geneviève Duchamp; Frédéric Verdier; Yannick Deshayes; François Marc; Yves Ousten; Yves Danto (Microelectron. Reliab., 2004)

Multi-level Modeling of Hot Carrier Injection for Reliability. - Corinne Bestory; François Marc; Hervé Levi; Yves Danto (FDL, 2006)

Statistical analysis during the reliability simulation. - Corinne Bestory; François Marc; Hervé Levi (Microelectron. Reliab., 2007)

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. - Corinne Bestory; François Marc; S. Duzellier; Hervé Levi (Microelectron. Reliab., 2009)

High Level Power and Energy Exploration Using ArchC. - Tushar Gupta; Clement Bertolini; Olivier Héron; Nicolas Ventroux; Thomas Zimmer; François Marc (SBAC-PAD, 2010)

Thermal aging model of InP/InGaAs/InP DHBT. - Sudip Ghosh 002; François Marc; Cristell Maneux; Brice Grandchamp; G. A. Koné; Thomas Zimmer (Microelectron. Reliab., 2010)

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Jean Godin (Microelectron. Reliab., 2010)

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. - Sudip Ghosh 002; Brice Grandchamp; G. A. Koné; François Marc; Cristell Maneux; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean-Yves Dupuy; Jean Godin (Microelectron. Reliab., 2011)

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean Godin (Microelectron. Reliab., 2011)

Advancements on reliability-aware analog circuit design. - Bertrand Ardouin; Jean-Yves Dupuy; Jean Godin; Virginie Nodjiadjim; Muriel Riet; François Marc; Gilles Amadou Koné; Sudip Ghosh 002; Brice Grandchamp; Cristell Maneux (ESSCIRC, 2012)

Relation between HCI-induced performance degradation and applications in a RISC processor. - Clement Bertolini; Olivier Héron; Nicolas Ventroux; François Marc (IOLTS, 2012)

Impact of Power Consumption and Temperature on Processor Lifetime Reliability. - Tushar Gupta; Clement Bertolini; Olivier Héron; Nicolas Ventroux; Thomas Zimmer; François Marc (J. Low Power Electron., 2012)

On the Simulation of HCI-Induced Variations of IC Timings at High Level. - Olivier Héron; Clement Bertolini; Chiara Sandionigi; Nicolas Ventroux; François Marc (J. Electron. Test., 2013)

Editorial. - Nathalie Labat; François Marc (Microelectron. Reliab., 2013)

Editorial. - Marise Bafleur; Philippe Perdu; François Marc; Hélène Frémont; Nicolas Nolhier (Microelectron. Reliab., 2015)

Design and implementation of a low cost test bench to assess the reliability of FPGA. - Mohammad Naouss; François Marc (Microelectron. Reliab., 2015)

Modelling delay degradation due to NBTI in FPGA Look-up tables. - Mohammad Naouss; François Marc (FPL, 2016)

FPGA LUT delay degradation due to HCI: Experiment and simulation results. - Mohammad Naouss; François Marc (Microelectron. Reliab., 2016)

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis. - Nathalie Labat; François Marc; Hélène Frémont; Marise Bafleur (Microelectron. Reliab., 2017)

Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories. - Julien Coutet; François Marc; Flavien Dozolme; Romain Guétard; Aurélien Janvresse; Pierre Lebossé; Antonin Pastre; Jean-Claude Clement (Microelectron. Reliab., 2018)

Simulation and modelling of long term reliability of digital circuits implemented in FPGA. - Jorgue Daniel Aguirre Morales; François Marc; A. Bensoussan; A. Durier (Microelectron. Reliab., 2018)

Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor. - Christopher H. Bennett; Jean-Etienne Lorival; François Marc; Theo Cabaret; Bruno Jousselme; Vincent Derycke; Jacques-Olivier Klein; Cristell Maneux (IEEE Trans. Multi Scale Comput. Syst., 2018)

Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current. - Marine Couret; Gerhard Fischer; Iria Garcia-Lopez; Magali De Matos; François Marc; Cristell Maneux (ESSDERC, 2019)

3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. - Arnaud Poittevin; Chhandak Mukherjee; Ian O'Connor; Cristell Maneux; Guilhem Larrieu; Marina Deng; Sébastien Le Beux; François Marc; Aurélie Lecestre; Cédric Marchand 002; Abhishek Kumar (VLSI-SoC (Selected Papers), 2020)

3D logic cells design and results based on Vertical NWFET technology including tied compact model. - C. Mukherjee 001; Marina Deng; François Marc; Cristell Maneux; Arnaud Poittevin; Ian O'Connor; Sébastien Le Beux; Abhishek Kumar; Aurélie Lecestre; Guilhem Larrieu (CoRR, 2020)

Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. - Sébastien Fregonese; Chhandak Mukherjee; Holger Rücker; Pascal Chevalier 002; Gerhard Fischer; Didier Céli; Marina Deng; Marine Couret; François Marc; Cristell Maneux; Thomas Zimmer (BCICTS, 2021)

Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors. - Lucas Réveil; Chhandak Mukherjee; Cristell Maneux; Marina Deng; François Marc; Abhishek Kumar; Aurélie Lecestre; Guilhem Larrieu; Arnaud Poittevin; Ian O'Connor; Oskar Baumgartner; David Pirker (VLSI-SoC, 2022)