The Detection and the control of Machine/Chamber Mismatching in Semiconductormanufacturing. - Aabir Chouichi; Jakey Blue; Claude Yugma; François Pasqualini (WSC, 2018)

New methods for SVM feature selection. - Tangui Aladjidi; François Pasqualini (CoRR, 2019)

Out-Of-Control Detection In Semiconductor Manufacturing using One-Class Support Vector Machines. - Ilham Rabhi; Agnès Roussy; François Pasqualini; Cyril Alegret (CASE, 2021)