Lock-in thermal IR imaging using a solid immersion lens. - O. Breitenstein; Frank Altmann; Thorsten Riediger; D. Karg; V. Gottschalk (Microelectron. Reliab., 2006)

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. - Rudolf Schlangen; Hervé Deslandes; Ted R. Lundquist; C. Schmidt; Frank Altmann; K. Yu; A. Andreasyan; S. Li (Microelectron. Reliab., 2010)

Novel techniques for dopant contrast analysis on real IC structures. - Joerg Jatzkowski; Michél Simon-Najasek; Frank Altmann (Microelectron. Reliab., 2012)

Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. - Michél Simon-Najasek; Susanne Hübner; Frank Altmann; Andreas Graff (Microelectron. Reliab., 2014)

Innovative Failure Analysis Techniques for 3-D Packaging Developments. - Frank Altmann; Matthias Petzold (IEEE Des. Test, 2016)

Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy. - Sebastian Brand 001; Michél Simon-Najasek; Michael Kögel; Joerg Jatzkowski; R. Portius; Frank Altmann (Microelectron. Reliab., 2016)

Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. - Mikael Broas; Andreas Graff; Michél Simon-Najasek; David Poppitz; Frank Altmann; Helmut Jung; Hervé Blanck (Microelectron. Reliab., 2016)

Magnetic field and current density imaging using off-line lock-in analysis. - Michael Kögel; Frank Altmann; Sebastian Tismer; Sebastian Brand 001 (Microelectron. Reliab., 2016)

Reliability evaluation of Si-dies due to assembly issues. - Falk Naumann; Volkmar Gottschalk; Bernd Burchard; Frank Altmann (Microelectron. Reliab., 2016)

Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. - Michél Simon-Najasek; Georg Lorenz; Achim Lindner; Frank Altmann (Microelectron. Reliab., 2016)

High resolution physical analysis of ohmic contact formation at GaN-HEMT devices. - Andreas Graff; Michél Simon-Najasek; Frank Altmann; Ján Kuzmík; Dagmar Gregusová; S. Hascik; Helmut Jung; T. Baur; Jan Grünenpütt; Hervé Blanck (Microelectron. Reliab., 2017)

Exploring the thermal limit of GaN power devices under extreme overload conditions. - Florian Peter Pribahsnik; Michael Nelhiebel; M. Mataln; Mirko Bernardoni; G. Prechtl; Frank Altmann; David Poppitz; A. Lindemann (Microelectron. Reliab., 2017)

Physical failure analysis methods for wide band gap semiconductor devices. - Andreas Graff; Michél Simon-Najasek; David Poppitz; Frank Altmann (IRPS, 2018)

New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. - Norbert Herfurth; Anne Beyreuther; Elham Amini; Christian Boit; Michél Simon-Najasek; Susanne Hübner; Frank Altmann; R. Herfurth; Chen Wu; Ingrid De Wolf; Kris Croes (IRPS, 2019)

Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling. - Enrico Zanoni; Matteo Meneghini; Gaudenzio Meneghesso; Fabiana Rampazzo; Daniele Marcon; Veronica Gao Zhan; Francesca Chiocchetta; Andreas Graff; Frank Altmann; Michél Simon-Najasek; David Poppitz (IRPS, 2020)

Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR). - Michael Kögel; Sebastian Brand 001; Christian Große; Kristof J. P. Jacobs; Ingrid De Wolf; Frank Altmann (CASE, 2021)

Nano Security: From Nano-Electronics to Secure Systems. - Ilia Polian; Frank Altmann; Tolga Arul; Christian Boit; Ralf Brederlow; Lucas Davi; Rolf Drechsler; Nan Du 004; Thomas Eisenbarth 001; Tim Güneysu; Sascha Hermann; Matthias Hiller; et al. (DATE, 2021)

Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis. - Xhani Marvin Saß; Thilo Krachenfels; Frederik Dermot Pustelnik; Jean-Pierre Seifert; Frank Altmann (ASHES@CCS, 2023)

Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis. - Xhani Marvin Saß; Thilo Krachenfels; Frederik Dermot Pustelnik; Jean-Pierre Seifert; Christian Große; Frank Altmann (CoRR, 2023)

Co3O4-Based Materials as Potential Catalysts for Methane Detection in Catalytic Gas Sensors. - Olena Yurchenko; Patrick Diehle; Frank Altmann; Katrin Schmitt; Jürgen Wöllenstein (Sensors, 2024)