Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. - Sverre Wichlund; Frank Berntsen; Einar J. Aas (DFT, 2006)

Scan Test Response Compaction Combined with Diagnosis Capabilities. - Sverre Wichlund; Frank Berntsen; Einar J. Aas (J. Electron. Test., 2008)