Macro Testability: The Results of Production Device Applications. - Frank Bouwman; Steven Oostdijk; Rudi Stans; Ben Bennetts; Frans P. M. Beenker (ITC, 1992)

Minimizing Test Time by Exploiting Parallelism in Macro Test. - Hans Bouwmeester; Steven Oostdijk; Frank Bouwman; Rudi Stans; Loek Thijssen; Frans P. M. Beenker (ITC, 1993)

Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. - Frank Bouwman; Taco Zwemstra; Sonny Hartanto; Keith Baker; Jan Koopmans (ITC, 1994)

Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip. - Bart Vermeulen; Steven Oostdijk; Frank Bouwman (ITC, 2001)