The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core. - Teresa L. McLaurin; Frank Frederick (ITC, 2000)

The Testability Features of The ARM1026EJ Microprocessor Core. - Teresa L. McLaurin; Frank Frederick; Rich Slobodnik (ITC, 2003)

A methodology for testing one-hot transmission gate multiplexers. - Teresa L. McLaurin; Frank Frederick; Rich Slobodnik (ITC, 2005)

Design for test features of the ARM clock control macro. - Frank Frederick; Teresa L. McLaurin (ITC, 2007)

The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor. - Teresa L. McLaurin; Frank Frederick; Rich Slobodnik (ITC, 2012)

3D-Split SRAM: Enabling Generational Gains in Advanced CMOS. - Rahul Mathur; Mudit Bhargava; Heath Perry; Alberto Cestero; Frank Frederick; Shawn Hung; Chien-Ju Chao; Daniel Smith; Daniel Fisher; Norman Robson; Xiaoqing Xu; Pranavi Chandupatla; et al. (CICC, 2021)

Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case Study. - Teresa L. McLaurin; Frank Frederick; Heath Perry; Shawn Hung; Saurabh Sinha (ETS, 2021)