Focused high- and low-energy ion milling for TEM specimen preparation. - Andriy Lotnyk; D. Poppitz; U. Ross; J. W. Gerlach; Frank Frost; S. Bernütz; E. Thelander; B. Rauschenbach (Microelectron. Reliab., 2015)

Can One Series of Self-Organized Nanoripples Guide Another Series of Self-Organized Nanoripples during Ion Bombardment: From the Perspective of Power Spectral Density Entropy? - Hengbo Li; Jinyu Li; Gaoyuan Yang; Ying Liu; Frank Frost; Yilin Hong (Entropy, 2023)