A New Flexible Algorithm for Random Yield Improvement. - Subarna Sinha; Qing Su; Linni Wen; Frank Lee 003; Charles C. Chiang; Yi-Kan Cheng; Jin-Lien Lin; Yu-Chyi Harn (ISQED, 2007)

An accurate and scalable MOSFET aging model for circuit simulation. - Bogdan Tudor; Joddy Wang; Zhaoping Chen; Robin Tan; Weidong Liu; Frank Lee 003 (ISQED, 2011)

A size sensitivity method for interactive MOS circuit sizing. - Jiajun Chen; Guoyong Shi; Andy Tai; Frank Lee 003 (NEWCAS, 2012)

Symbolic time-varying root-locus analysis for oscillator design. - Yan Zhu; Guoyong Shi; Frank Lee 003; Andy Tai (NEWCAS, 2012)

An accurate MOSFET aging model for 28 nm integrated circuit simulation. - Bogdan Tudor; Joddy Wang; Zhaoping Chen; Robin Tan; Weidong Liu; Frank Lee 003 (Microelectron. Reliab., 2012)

Topological symbolic simplification for analog design. - Hanbin Hu; Guoyong Shi; Andy Tai; Frank Lee 003 (ISCAS, 2015)

Advanced Reliability-Aware Verification for Robust Circuit Design. - Joddy Wang; Frank Lee 003 (ASICON, 2019)