Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application. - Lei Shi; Stoyan N. Nihtianov; Frank Scholze 002; Lis K. Nanver (IECON, 2012)

Electrical and Optical Performance Investigation of Si-Based Ultrashallow-Junction p+-n VUV/EUV Photodiodes. - Lei Shi; Stoyan N. Nihtianov; Sha Xia; Lis K. Nanver; Alexander Gottwald; Frank Scholze 002 (IEEE Trans. Instrum. Meas., 2012)