Failure analysis of vertical cavity surface emission laser diodes. - Frank Siegelin (Microelectron. Reliab., 2004)

ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. - Liming Gao; Christian Burmer; Frank Siegelin (Microelectron. Reliab., 2006)

Localization and physical analysis of a complex SRAM failure in 90nm technology. - Zhongling Qian; Frank Siegelin; Birgit Tippelt; Stefan Müller (Microelectron. Reliab., 2006)