Automatic Scan Insertion and Test Generation for Asynchronous Circuits. - Frank te Beest; Ad M. G. Peeters; Marc Verra; Kees van Berkel 001; Hans G. Kerkhoff (ITC, 2002)

Synchronous Full-Scan for Asynchronous Handshake Circuits. - Frank te Beest; Ad M. G. Peeters; Kees van Berkel 001; Hans G. Kerkhoff (J. Electron. Test., 2003)

Adding synchronous and LSSD modes to asynchronous circuits. - Kees van Berkel 001; Ad M. G. Peeters; Frank te Beest (Microprocess. Microsystems, 2003)

A Multiplexor Based Test Method for Self-Timed Circuits. - Frank te Beest; Ad M. G. Peeters (ASYNC, 2005)

Click Elements: An Implementation Style for Data-Driven Compilation. - Ad M. G. Peeters; Frank te Beest; Mark de Wit; Willem C. Mallon (ASYNC, 2010)