Systematic and Structured Methods for Digital Board Testing. - Frans P. M. Beenker (ITC, 1985)

Design-for-testability of PLA's using statistical cooling. - Michiel M. Ligthart; Emile H. L. Aarts; Frans P. M. Beenker (DAC, 1986)

Macro Testing: Unifying IC and Board Test. - Frans P. M. Beenker; Karel J. E. van Eerdewijk; Robert B. W. Gerritsen; Frank N. Peacock; Max van der Star (IEEE Des. Test, 1986)

Fault Modeling and Test Algorithm Development. - Frans P. M. Beenker; Rob Dekker; Loek Thijssen (ITC, 1988)

A Realistic Self-Test Machine for Static Random Access Memories. - Frans P. M. Beenker; Rob Dekker; Loek Thijssen (ITC, 1988)

A Testability Strategy for Silicon Compilers. - Frans P. M. Beenker; Rob Dekker; Rudi Stans; Max van der Star (ITC, 1989)

Realistic built-in self-test for static RAMs. - Rob Dekker; Frans P. M. Beenker; Loek Thijssen (IEEE Des. Test, 1989)

Implementing Macro Test in Silicon Compiler Design. - Frans P. M. Beenker; Barry J. Dekker; Richard Stans; Max van der Star (IEEE Des. Test Comput., 1990)

A realistic fault model and test algorithms for static random access memories. - Rob Dekker; Frans P. M. Beenker; Loek Thijssen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

Macro Testability: The Results of Production Device Applications. - Frank Bouwman; Steven Oostdijk; Rudi Stans; Ben Bennetts; Frans P. M. Beenker (ITC, 1992)

Minimizing Test Time by Exploiting Parallelism in Macro Test. - Hans Bouwmeester; Steven Oostdijk; Frank Bouwman; Rudi Stans; Loek Thijssen; Frans P. M. Beenker (ITC, 1993)