Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects. - Franziska Pöller; Félix Salazar Bloise; Martin Jakobi; Shengjia Wang; Jie Dong 005; Alexander W. Koch (Sensors, 2019)

Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain. - Franziska Pöller; Félix Salazar Bloise; Martin Jakobi; Jie Dong 005; Alexander W. Koch (Sensors, 2021)