Flip-Trees: Fault-Tolerant Graphs with Wide Containers. - Fred J. Meyer; Dhiraj K. Pradhan (IEEE Trans. Computers, 1988)

Dynamic Testing Strategy for Distributed Systems. - Fred J. Meyer; Dhiraj K. Pradhan (IEEE Trans. Computers, 1989)

Modeling Defect Spatial Distribution. - Fred J. Meyer; Dhiraj K. Pradhan (IEEE Trans. Computers, 1989)

Consensus With Dual Failure Modes. - Fred J. Meyer; Dhiraj K. Pradhan (IEEE Trans. Parallel Distributed Syst., 1991)

Communication structures in fault-tolerant distributed systems. - Dhiraj K. Pradhan; Fred J. Meyer (Networks, 1993)

Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. - D. D. Sharma; Fred J. Meyer; Dhiraj K. Pradhan (IEEE Trans. Very Large Scale Integr. Syst., 1993)

A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. - Wei-Kang Huang; M. Y. Zhang; Fred J. Meyer; Fabrizio Lombardi (Asian Test Symposium, 1997)

Testing of programmable logic devices (PLD) with faulty resources. - David Ashen; Fred J. Meyer; Nohpill Park; Fabrizio Lombardi (DFT, 1997)

Multiple fault detection in logic resources of FPGAs. - Wei Liang Huang; Fred J. Meyer; Fabrizio Lombardi (DFT, 1997)

Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. - Fred J. Meyer; Xiao-Tao Chen; Wei-Kang Huang; Fabrizio Lombardi (FTCS, 1997)

On the Fault Coverage of Interconnect Diagnosis. - Xiao-Tao Chen; Fred J. Meyer; Fabrizio Lombardi (VTS, 1997)

Fault Detection in a Tristate System Environment. - Wenyi Feng; Wei-Kang Huang; Fred J. Meyer; Fabrizio Lombardi (Asian Test Symposium, 1998)

On the Complexity of Sequential Testing in Configurable FPGAs. - Wenyi Feng; Fred J. Meyer; Wei-Kang Huang; Fabrizio Lombardi (DFT, 1998)

A New Method for Testing EEPLA's. - Avinash Munshi; Fred J. Meyer; Fabrizio Lombardi (DFT, 1998)

Fault Detection and Diagnosis of Interconnects of Random Access Memories. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (VTS, 1998)

Structural diagnosis of interconnects by coloring. - Xiao-Tao Chen; Fred J. Meyer; Fabrizio Lombardi (ACM Trans. Design Autom. Electr. Syst., 1998)

Testing configurable LUT-based FPGA's. - Wei-Kang Huang; Fred J. Meyer; Xiao-Tao Chen; Fabrizio Lombardi (IEEE Trans. Very Large Scale Integr. Syst., 1998)

A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. - Wenyi Feng; Wei-Kang Huang; Fred J. Meyer; Fabrizio Lombardi (Asian Test Symposium, 1999)

Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. - Wenyi Feng; Xiao-Tao Chen; Fred J. Meyer; Fabrizio Lombardi (DFT, 1999)

Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. - Wenyi Feng; Fred J. Meyer; Fabrizio Lombardi (DFT, 1999)

Good Processor Identification in Two-Dimensional Grids. - Fred J. Meyer; Fabrizio Lombardi; Jun Zhao 005 (DFT, 1999)

Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. - Wenyi Feng; Fred J. Meyer; Fabrizio Lombardi (FTCS, 1999)

Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (MTDT, 1999)

Maximal Diagnosis of Interconnects of Random Access Memories. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (VTS, 1999)

Design Verification of FPGA Implementations. - Xiao-Tao Chen; Wei-Kang Huang; Nohpill Park; Fred J. Meyer; Fabrizio Lombardi (IEEE Des. Test Comput., 1999)

Guest Editors' Introduction: DRAM Architecture and Testing. - Bruce F. Cockburn; Fabrizio Lombardi; Fred J. Meyer (IEEE Des. Test Comput., 1999)

Adaptive Fault Detection and Diagnosis of RAM Interconnects. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (J. Electron. Test., 1999)

Reconfiguring one-time programmable FPGAs. - Xiao-Tao Chen; Wenyi Feng; Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (IEEE Micro, 1999)

Test generation and scheduling for layout-based detection of bridge faults in interconnects. - Tong Liu 007; Xiao-Tao Chen; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Very Large Scale Integr. Syst., 1999)

Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. - Wenyi Feng; Fred J. Meyer; Fabrizio Lombardi (IPDPS Workshops, 2000)

Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (MTDT, 2000)

An Approach for Detecting Multiple Faulty FPGA Logic Blocks. - Wei-Kang Huang; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Computers, 2000)

Testing and testable designs for one-time programmable FPGAs. - Tong Liu 007; Wei-Kang Huang; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000)

Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. - Xiao-Tao Chen; Wei-Kang Huang; Nohpill Park; Fred J. Meyer; Fabrizio Lombardi (DFT, 2001)

Connectivity-Based Multichip Module Repair. - Minsu Choi; Nohpill Park; Fred J. Meyer; Fabrizio Lombardi (PRDC, 2001)

Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi (DFT, 2002)

Random Testing of Multi-Port Static Random Access Memories. - Farzin Karimi; Fred J. Meyer; Fabrizio Lombardi (MTDT, 2002)

Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi (IEEE Des. Test Comput., 2002)

Quality-effective repair of multichip module systems. - Nohpill Park; Fred J. Meyer; Fabrizio Lombardi (J. Syst. Archit., 2002)

A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. - Fengming Zhang; Young-Jun Lee; Thomas Kane; Luca Schiano; Mariam Momenzadeh; Yong-Bin Kim; Fred J. Meyer; Fabrizio Lombardi; Solomon Max; Phil Perkinson (DFT, 2003)

Hybrid Multisite Testing at Manufacturing. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi; Farzin Karimi (ITC, 2003)

Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. - Wenyi Feng; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Computers, 2003)

Predicting Defect-Tolerant Yield in the Embedded Core Context. - Fred J. Meyer; Nohpill Park (IEEE Trans. Computers, 2003)

Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. - Young-Jun Lee; Thomas Kane; Jong-Jin Lim; Young Jun Schiano; Yong-Bin Kim; Fred J. Meyer; Fabrizio Lombardi; Solomon Max (IEEE Trans. Instrum. Meas., 2003)

Maximal diagnosis of interconnects of random access memories. - Jun Zhao 005; Fred J. Meyer; Fabrizio Lombardi; Nohpill Park (IEEE Trans. Reliab., 2003)

Reliability Modeling and Assurance of Clockless Wave Pipeline. - Tao Feng; Nohpill Park; Yong-Bin Kim; Fabrizio Lombardi; Fred J. Meyer (DFT, 2004)

On The Yield of Compiler-Based eSRAMs. - Xiaopeng Wang; Marco Ottavi; Fred J. Meyer; Fabrizio Lombardi (DFT, 2004)

Simulation of reconfigurable memory core yield. - Marco Ottavi; Xiaopeng Wang; Fred J. Meyer; Fabrizio Lombardi (ACM Great Lakes Symposium on VLSI, 2004)

Guest editorial. - Cristiana Bolchini; Fred J. Meyer (J. Syst. Archit., 2004)

Analysis and measurement of fault coverage in a combined ATE and BIST environment. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2004)

Sequential diagnosis of processor array systems. - Jun Zhao 005; Fred J. Meyer; Nohpill Park; Fabrizio Lombardi (IEEE Trans. Reliab., 2004)

QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. - Zachary D. Patitz; Nohpill Park; Minsu Choi; Fred J. Meyer (DFT, 2005)

Analysis and evaluation of multisite testing for VLSI. - Hamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2005)

Evaluating the Yield of Repairable SRAMs for ATE. - Marco Ottavi; Luca Schiano; Xiaopeng Wang; Yong-Bin Kim; Fred J. Meyer; Fabrizio Lombardi (IEEE Trans. Instrum. Meas., 2006)

Measuring the timing jitter of ATE in the frequency domain. - Luca Schiano; Mariam Momenzadeh; Fengming Zhang; Young-Jun Lee; Thomas Kane; Solomon Max; Philip Perkins; Yong-Bin Kim; Fabrizio Lombardi; Fred J. Meyer (IEEE Trans. Instrum. Meas., 2006)