"Multidimensional reflectometry for industry" (xD-Reflect) an European research project. - Andreas Höpe; Annette Koo; Francisco Martínez-Verdú; Frédéric B. Leloup; Gaël Obein; Gerd Wübbeler; Joaquín Campos 001; Paola Iacomussi; Priit Jaanson; Stefan Källberg; Marek Smíd (Measuring, Modeling, and Reproducing Material Appearance, 2014)

Rapid determination of the photometric bidirectional scatter distribution function by use of a near-field goniophotometer. - Frédéric B. Leloup; Ward De Ketelaere; Jan Audenaert; Peter Hanselaer (Measuring, Modeling, and Reproducing Material Appearance, 2014)

Metrological issues related to BRDF measurements around the specular direction in the particular case of glossy surfaces. - Gaël Obein; Jan Audenaert; Guillaume Ged; Frédéric B. Leloup (Measuring, Modeling, and Reproducing Material Appearance, 2015)

Wavelength Selection Considerations for Optical Wireless Positioning Systems. - Jorik De Bruycker; Frédéric B. Leloup; Nobby Stevens (ISCC, 2023)

A Handheld Image-based Gloss Meter for Complete Gloss Characterization. - Stijn Beuckels; Jan Audenaert; Pierre Morandi; Frédéric B. Leloup (LIM, 2023)

A Pipeline for Characterising Virtual Reality Head Mounted Displays. - Ujjayanta Bhaumik; Laurens Van de Perre; Frédéric B. Leloup (LIM, 2024)

Design of a Snapshot Hyperspectral Gonioradiometer for Appearance Characterization. - Nathan Slembrouck; Jan Audenaert; Frédéric B. Leloup (LIM, 2024)