Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift. - Jérôme Vaillant; Thomas Decroux; Emilie Huss; Frédéric Barbier; Didier Hérault; Flavien Hirigoyen; Nicolas Virollet (Digital Photography, 2008)

ESD sensitivity investigation on a wide range of high density embedded capacitors. - Frédéric Barbier; Sébastien Jacqueline (Microelectron. Reliab., 2008)

Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method. - Jean Luc Lefebvre; Christian Gautier; Frédéric Barbier (Microelectron. Reliab., 2009)