A New Laser System for X-Rays Flashes Sensitivity Evaluation. - Dean Lewis; Hervé Lapuyade; Yann Deval; Yvan Maidon; Frédéric Darracq; Renaud Briand; Pascal Fouillat (IOLTW, 2001)

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. - Frédéric Darracq; Hervé Lapuyade; Nadine Buard; Pascal Fouillat; R. Dufayel; Thierry Carrière (Microelectron. Reliab., 2003)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. - Nogaye Mbaye; Vincent Pouget; Frédéric Darracq; Dean Lewis (Microelectron. Reliab., 2013)

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. - I. El Moukhtari; Vincent Pouget; C. Larue; Frédéric Darracq; Dean Lewis; Philippe Perdu (Microelectron. Reliab., 2013)

A comprehensive study of the application of the EOP techniques on bipolar devices. - Mohamed Mehdi Rebaï; Frédéric Darracq; Jean-Paul Guillet; Elise Bernou; Kevin Sanchez; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2014)

TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices. - Kalparupa Mukherjee; Frédéric Darracq; Arnaud Curutchet; Nathalie Malbert; Nathalie Labat (Microelectron. Reliab., 2017)

Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors. - Kalparupa Mukherjee; Frédéric Darracq; Arnaud Curutchet; Nathalie Malbert; Nathalie Labat (IRPS, 2018)

A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications. - Leonardo Heitich Brendler; Hervé Lapuyade; Yann Deval; Frédéric Darracq; Frédéric Fauquet; Ricardo Reis 001; François Rivet (IEEE Trans. Circuits Syst. I Regul. Pap., 2023)