Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM. - Frederic Duvivier; M. Rivier; B. Burtschy; J. J. Charlot (DFT, 1993)

Approximation of critical area of ICs with simple parameters extracted from the layout. - Frederic Duvivier; M. Rivier (DFT, 1995)

Application of a Survey Sampling Critical Area Computation Tool in a Manufacturing Environment. - Frederic Duvivier; Gerard A. Allan (DFT, 1996)

Application of a yield model merging critical areas and defectivity to industrial products. - Sandra Levasseur; Frederic Duvivier (DFT, 1997)

Management of Critical Areas and Defectivity Data for Yield Trend Modeling. - Sandrine Barberan; Frederic Duvivier (DFT, 1998)

Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production. - Frederic Duvivier (DFT, 1999)