Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology. - Rui Liu; Dominique M. M.-P. Schreurs; Walter De Raedt; Frederik Vanaverbeke; J. Das; Robert Mertens 004; Ingrid De Wolf (Microelectron. Reliab., 2011)

Thermal optimization of GaN-on-Si HEMTs with plastic package. - Rui Liu; Dominique M. M.-P. Schreurs; Walter De Raedt; Frederik Vanaverbeke; Robert Mertens 004; Ingrid De Wolf (Microelectron. Reliab., 2011)

Characterization of the Self-Enhanced Class J PA Operating Mode in LDMOS and GaN Transistors. - Frederik Vanaverbeke; Michael Satinu; Kevin Kim (BCICTS, 2019)