The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination. - Munaf Rahimo; Frank Richter; Fabian Fischer 002; Umamaheswara Vemulapati; Arnost Kopta; Chiara Corvasce; Silvan Geissmann; Marco Bellini; Martin J. Bayer; Friedhelm Bauer (Microelectron. Reliab., 2016)