ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. - Harald P. E. Vranken; Friedrich Hapke; Soenke Rogge; Domenico Chindamo; Erik H. Volkerink (ITC, 2003)

Efficient Pattern Mapping for Deterministic Logic BIST. - Valentin Gherman; Hans-Joachim Wunderlich; Harald P. E. Vranken; Friedrich Hapke; Michael Wittke; Michael Garbers (ITC, 2004)

X-Masking During Logic BIST and Its Impact on Defect Coverage. - Yuyi Tang; Hans-Joachim Wunderlich; Harald P. E. Vranken; Friedrich Hapke; Michael Wittke; Piet Engelke; Ilia Polian; Bernd Becker 001 (ITC, 2004)

PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. - Junhao Shi; Görschwin Fey; Rolf Drechsler; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel (ISVLSI, 2005)

Fault detection and diagnosis with parity trees for space compaction of test responses. - Harald P. E. Vranken; Sandeep Kumar Goel; Andreas Glowatz; Jürgen Schlöffel; Friedrich Hapke (DAC, 2006)

X-masking during logic BIST and its impact on defect coverage. - Yuyi Tang; Hans-Joachim Wunderlich; Piet Engelke; Ilia Polian; Bernd Becker 001; Jürgen Schlöffel; Friedrich Hapke; Michael Wittke (IEEE Trans. Very Large Scale Integr. Syst., 2006)

Experimental Studies on SAT-Based ATPG for Gate Delay Faults. - Stephan Eggersglüß; Daniel Tille; Görschwin Fey; Rolf Drechsler; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel (ISMVL, 2007)

Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. - Jeroen Geuzebroek; Erik Jan Marinissen; Ananta K. Majhi; Andreas Glowatz; Friedrich Hapke (ITC, 2007)

Programmable deterministic Built-In Self-Test. - Abdul Wahid Hakmi; Hans-Joachim Wunderlich; Christian G. Zoellin; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel; Laurent Souef (ITC, 2007)

Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. - Stephan Eggersglüß; Görschwin Fey; Rolf Drechsler; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel (MEMOCODE, 2007)

On Acceleration of SAT-Based ATPG for Industrial Designs. - Rolf Drechsler; Stephan Eggersglüß; Görschwin Fey; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel; Daniel Tille (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. - Friedrich Hapke; Rene Krenz-Baath; Andreas Glowatz; Jürgen Schlöffel; Hamidreza Hashempour; Stefan Eichenberger; Camelia Hora; Dan Adolfsson (ITC, 2009)

Using a two-dimensional fault list for compact Automatic Test Pattern Generation. - Marc Messing; Andreas Glowatz; Friedrich Hapke; Rolf Drechsler (LATW, 2009)

Restrict Encoding for Mixed-Mode BIST. - Abdul Wahid Hakmi; Stefan Holst; Hans-Joachim Wunderlich; Jürgen Schlöffel; Friedrich Hapke; Andreas Glowatz (VTS, 2009)

Defect-oriented cell-internal testing. - Friedrich Hapke; Wilfried Redemund; Jürgen Schlöffel; Rene Krenz-Baath; Andreas Glowatz; Michael Wittke; Hamidreza Hashempour; Stefan Eichenberger (ITC, 2010)

MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. - Stephan Eggersglüß; Görschwin Fey; Andreas Glowatz; Friedrich Hapke; Jürgen Schlöffel; Rolf Drechsler (J. Electron. Test., 2010)

Cell-aware analysis for small-delay effects and production test results from different fault models. - Friedrich Hapke; Jürgen Schlöffel; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; J. Rearick; Jason Rivers (ITC, 2011)

EDA solutions to new-defect detection in advanced process technologies. - Erik Jan Marinissen; Gilbert Vandling; Sandeep Kumar Goel; Friedrich Hapke; Jason Rivers; Nikolaus Mittermaier; Swapnil Bahl (DATE, 2012)

A new SAT-based ATPG for generating highly compacted test sets. - Stephan Eggersglüß; Rene Krenz-Baath; Andreas Glowatz; Friedrich Hapke; Rolf Drechsler (DDECS, 2012)

Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. - Rene Krenz-Baath; Friedrich Hapke; Rolf Hinze; Reinhard Meier; Maija Ryynaenen; Andreas Glowatz (DSD, 2012)

Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. - Friedrich Hapke; Jürgen Schlöffel (ETS, 2012)

Cell-aware Production test results from a 32-nm notebook processor. - Friedrich Hapke; Michael Reese; Jason Rivers; A. Over; V. Ravikumar; Wilfried Redemund; Andreas Glowatz; Jürgen Schlöffel; Janusz Rajski (ITC, 2012)

Fault collapsing of multi-conditional faults. - Rene Krenz-Baath; Andreas Glowatz; Friedrich Hapke (DDECS, 2013)

Industrial Application of IEEE P1687 for an Automotive Product. - Martin Keim; Tom Waayers; Richard Morren; Friedrich Hapke; Rene Krenz-Baath (DSD, 2013)

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. - Huaxing Tang; Brady Benware; Michael Reese; Joseph Caroselli; Thomas Herrmann; Friedrich Hapke; Robert Tao; Wu-Tung Cheng; Manish Sharma (ATS, 2014)

Cell-aware experiences in a high-quality automotive test suite. - Friedrich Hapke; Ralf Arnold; Matthias Beck; M. Baby; S. Straehle; J. F. Goncalves; A. Panait; R. Behr; Gwenolé Maugard; A. Prashanthi; Juergen Schloeffel; Wilfried Redemund; et al. (ETS, 2014)

Cell-Aware Test. - Friedrich Hapke; Wilfried Redemund; Andreas Glowatz; Janusz Rajski; Michael Reese; Marek Hustava; Martin Keim; Juergen Schloeffel; Anja Fast (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Embedded deterministic test points for compact cell-aware tests. - Cesar Acero; Derek Feltham; Friedrich Hapke; Elham K. Moghaddam; Nilanjan Mukherjee 001; Vidya Neerkundar; Marek Patyra; Janusz Rajski; Jerzy Tyszer; Justyna Zawada (ITC, 2015)

Diagnosing timing related cell internal defects for FinFET technology. - Huaxing Tang; Ting-Pu Tai; Wu-Tung Cheng; Brady Benware; Friedrich Hapke (VLSI-DAT, 2015)

Cell-aware diagnosis: Defective inmates exposed in their cells. - Peter C. Maxwell; Friedrich Hapke; Huaxing Tang (ETS, 2016)

On New Test Points for Compact Cell-Aware Tests. - Cesar Acero; Derek Feltham; Marek Patyra; Friedrich Hapke; Elham K. Moghaddam; Nilanjan Mukherjee 001; Vidya Neerkundar; Janusz Rajski; Jerzy Tyszer; Justyna Zawada (IEEE Des. Test, 2016)

Bridge over troubled waters: Critical area based pattern generation. - Peter C. Maxwell; Friedrich Hapke; Maija Ryynaenen; Peter Weseloh (ETS, 2017)

Total Critical Area Based Testing. - Friedrich Hapke; Peter C. Maxwell (ITC, 2018)

DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. - Will Howell; Friedrich Hapke; Edward Brazil; Srikanth Venkataraman; R. Datta; Andreas Glowatz; Wilfried Redemund; J. Schmerberg; Anja Fast; Janusz Rajski (ITC, 2018)

Defect-Oriented Test: Effectiveness in High Volume Manufacturing. - Friedrich Hapke; Will Howell; Peter C. Maxwell; Edward Brazil; Srikanth Venkataraman; Rudrajit Dutta; Andreas Glowatz; Anja Fast; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)