A Non-Volatile Embedded Memory for High Temperature Automotive and High-Retention Applications. - M. Thomas; J. Pathak; J. Payne; Friedrich Peter Leisenberger; Ewald Wachmann; Gregor Schatzberger; Andreas Wiesner; Martin Schrems (ISQED, 2006)

Scalable High Voltage CMOS technology for Smart Power and sensor applications. - Martin Schrems; Martin Knaipp; Hubert Enichlmair; Verena Vescoli; Rainer Minixhofer; Ehrenfried Seebacher; Friedrich Peter Leisenberger; Ewald Wachmann; Gregor Schatzberger; Heimo Gensinger (Elektrotech. Informationstechnik, 2008)

Variation and failure characterization through pattern classification of test data from multiple test stages. - Chun-Kai Hsu; Peter Sarson; Gregor Schatzberger; Friedrich Peter Leisenberger; John M. Carulli Jr.; Siddhartha Siddhartha; Kwang-Ting Cheng (ITC, 2016)

Yield improvement of an EEPROM for automotive applications while maintaining high reliability. - Gregor Schatzberger; Friedrich Peter Leisenberger; Peter Sarson (VTS, 2016)

An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories. - Friedrich Peter Leisenberger; Gregor Schatzberger (J. Electron. Test., 2016)

Fast Bit Screening of Automotive Grade EEPROMs - Continuous Improvement Exercise. - Peter G. Sarson; Gregor Schatzberger; Friedrich Peter Leisenberger (IEEE Trans. Very Large Scale Integr. Syst., 2017)

High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. - Gregor Schatzberger; Friedrich Peter Leisenberger; Peter Sarson; Andreas Wiesner (VTS, 2018)