Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing. - Friedrich Taenzler; Thomas Novak 003; Erich Kubalek (VTS, 1993)

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. - Ganesh Srinivasan; Friedrich Taenzler; Abhijit Chatterjee (DATE, 2006)

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. - Ganesh Srinivasan; Abhijit Chatterjee; Friedrich Taenzler (VTS, 2006)

Production Test of High Volume Commercial RFIC. - Friedrich Taenzler (ATS, 2007)

Optimized EVM Testing for IEEE 802.11a/n RF ICs. - Erkan Acar; Sule Ozev; Ganesh Srinivasan; Friedrich Taenzler (ITC, 2008)

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. - Ganesh Srinivasan; Hui-Chuan Chao; Friedrich Taenzler (ITC, 2008)

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. - Ganesh Srinivasan; Friedrich Taenzler; Abhijit Chatterjee (IEEE Des. Test Comput., 2008)

RADPro: Automatic RF analyzer and diagnostic program generation tool. - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzlar; Richard Antley; Craig Force; Falah Mohammed (ITC, 2010)

Low cost test and tuning of RF circuits and systems. - Abhijit Chatterjee; Friedrich Taenzler (VTS, 2010)

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. - Vishwanath Natarajan; Shreyas Sen; Aritra Banerjee; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler (IEEE Des. Test Comput., 2010)

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. - Sukeshwar Kannan; Bruce C. Kim; Ganesh Srinivasan; Friedrich Taenzler; Richard Antley; Craig Force (J. Electron. Test., 2011)

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. - Vishwanath Natarajan; Hyun Woo Choi; Aritra Banerjee; Shreyas Sen; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler; Soumendu Bhattacharya (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Physics Based Fault Models for Testing High-Voltage LDMOS. - Sukeshwar Kannan; Bruce C. Kim; Anurag Gupta; Friedrich Taenzler; Richard Antley; Ken Moushegian (VLSI Design, 2013)

Physics-Based Low-Cost Test Technique for High Voltage LDMOS. - Sukeshwar Kannan; Kaushal Kannan; Bruce C. Kim; Friedrich Taenzler; Richard Antley; Ken Moushegian; Kenneth M. Butler; Doug Mirizzi (J. Electron. Test., 2013)

A novel BIST technique for LDMOS drivers. - Bruce C. Kim; Saikat Mondal; Friedrich Taenzler; Kenneth Moushegian (MWSCAS, 2014)

Development and empirical verification of an accuracy model for the power down leakage tests. - Jae Woong Jeong; Sule Ozev; Friedrich Taenzler; Hui-Chuan Chao (VTS, 2014)