Design optimization of ESD protection and latchup prevention for a serial I/O IC. - Chih-Yao Huang; Wei-Fang Chen; Song-Yu Chuan; Fu-Chien Chiu; Jeng-Chou Tseng; I-Cheng Lin; Chuan-Jane Chao; Len-Yi Leu; Ming-Dou Ker (Microelectron. Reliab., 2004)

Electrical properties of metal-HfO2-silicon system measured from metal-insulator-semiconductor capacitors and metal-insulator-semiconductor field-effect transistors using HfO2 gate dielectric. - Fu-Chien Chiu; Shun-An Lin; Joseph Ya-min Lee (Microelectron. Reliab., 2005)

An investigation of surface state capture cross-sections for metal-oxide-semiconductor field-effect transistors using HfO2 gate dielectrics. - Fu-Chien Chiu; Wen-Chieh Shih; Joseph Ya-min Lee; Huey-Liang Hwang (Microelectron. Reliab., 2007)