Proportional difference estimate method of determining characteristic parameters of normal and log-normal distributions. - Fuchen Mu; Changhua Tan; Mingzhen Xu (Microelectron. Reliab., 2001)

A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd. - Fuchen Mu; Mingzhen Xu; Changhua Tan; Xiaorong Duan (Microelectron. Reliab., 2001)

Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. - Fuchen Mu; Mingzhen Xu; Changhua Tan; Xiaorong Duan (Microelectron. Reliab., 2002)