Three-dimensional finite-element thermal simulation of GaN-based HEMTs. - Fulvio Bertoluzza; Nicola Delmonte; Roberto Menozzi (Microelectron. Reliab., 2009)

Coupled measurement-simulation procedure for very high power fast recovery - Soft behavior diode design and testing. - Fulvio Bertoluzza; Paolo Cova; Nicola Delmonte; Pietro Pampili; Marco Portesine (Microelectron. Reliab., 2010)

Fault tolerant digital control of 2 MVA parallelable frequency converters for harbor applications. - Andrea Toscani; Paolo Cova; Fulvio Bertoluzza; Nicola Pini; Giovanni Franceschini (IECON, 2012)