Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. - Fulvio Infante; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2009)

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. - Fulvio Infante; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2010)

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. - Fulvio Infante; Philippe Perdu; H. B. Kor; Chee Lip Gan; Dean Lewis (Microelectron. Reliab., 2011)

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization. - Nicolas Courjault; Philippe Perdu; Fulvio Infante; Thierry Lebey; Vincent Bley (Microelectron. Reliab., 2015)

Single Event Transient acquisition and mapping for space device Characterization. - Roberta Pilia; Guillaume Bascoul; Kevin Sanchez; Giovanna Mura; Fulvio Infante (Microelectron. Reliab., 2016)