FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (ESSCIRC, 2016)

Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (IET Circuits Devices Syst., 2018)

Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. - Kan Takeuchi; Masaki Shimada; Shinya Konishi; Daisuke Oshida; Naoya Ota; Takashi Yasumasu; Koji Shibutani; Tomohiro Iwashita; Tetsuya Kokubun; Fumio Tsuchiya (IRPS, 2019)