Study of the DC Performance of Fabricated Magnetic Tunnel Junction Integrated on Back-End Metal Line of CMOS Circuits. - Fumitaka Iga; Masashi Kamiyanagi; Shoji Ikeda; Katsuya Miura; Jun Hayakawa; Haruhiro Hasegawa; Takahiro Hanyu; Hideo Ohno; Tetsuo Endoh (IEICE Trans. Electron., 2010)

Transient Characteristic of Fabricated Magnetic Tunnel Junction (MTJ) Programmed with CMOS Circuit. - Masashi Kamiyanagi; Fumitaka Iga; Shoji Ikeda; Katsuya Miura; Jun Hayakawa; Haruhiro Hasegawa; Takahiro Hanyu; Hideo Ohno; Tetsuo Endoh (IEICE Trans. Electron., 2010)