Desktop Teleoperation via the World Wide Web. - Hisayuki Aoyama; Futoshi Iwata; Akira Sasaki (ICRA, 1995)

Miniature Robot with Micro Capillary Capturing Probe for Surface Clearing Operation. - Hisayuki Aoyama; Futoshi Iwata; Jisuke Fukaya; Akira Sasaki (J. Robotics Mechatronics, 1995)

Development of novel nanomanipulators based on scanning probe microscopes. - Futoshi Iwata (MHS, 2011)

Interactive nano manipulator based on an atomic force microscope for scanning electron microscopy. - Masaki Takahashi; Hideyuki Ko; Tatsuo Ushiki; Futoshi Iwata (MHS, 2011)

Single cell scraper based on an Atomic Force Microscope. - Makoto Adachi; Yuya Mizuguchi; Futoshi Iwata (MHS, 2012)

Influence of charged samples on imaging in scanning ion conductance microscopy. - Kimihiro Ishizaki; Tatsuo Ushiki; Masato Nakajima; Futoshi Iwata (MHS, 2013)

Directly measurement of shear force of a single adhesion cell using a self-sensitive cantilever. - Shigetaka Hashimoto; Makoto Adachi; Futoshi Iwata (MHS, 2014)

Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipette. - Satoshi Sakurai; Koji Yamazaki; Tatsuo Ushiki; Futoshi Iwata (MHS, 2014)

Measurement of shear force and adhesion force of a single adhesion cell using atomic force microscopy with a self-sensitive cantilever. - Shigetaka Hashimoto; Futoshi Iwata (MHS, 2015)

Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid. - Kohei Iwasaki; Yuki Takeda; Futoshi Iwata (MHS, 2016)

Topographical imaging and charge mapping of charged surface using scanning ion conductance microscopy with a theta nanopipette. - Tatsuru Shirasawa; Yusuke Mizutani; Tatsuo Ushiki; Futoshi Iwata (MHS, 2017)

Fine processing of polymer surface by irradiating local atmospheric pressure plasma jets using helium source gas mixed with water vapor. - Sho Yamamoto; Daisuke Morimatsu; Hiromitsu Nakamura; Akihisa Ogino; Masaaki Nagatsu; Futoshi Iwata (MHS, 2017)

Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy. - Takeshi Uruma; Nobuo Satoh; Hidekazu Yamamoto; Futoshi Iwata (MHS, 2018)

Micro Fabrication Technique for Three-dimensional Structures based on Localized Electrophoretic Deposition using a Scanning Ion Conductance Microscope. - Masayoshi Yoshioka; Futoshi Iwata (MHS, 2018)

Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode. - Kenta Katakura; Kenta Nakazawa; Futoshi Iwata (MHS, 2019)

Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope. - Kenta Nakazawa; Kengo Fukazawa; Takeshi Uruma; Gen Hashiguchi; Futoshi Iwata (IEEE Trans. Instrum. Meas., 2022)