Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface. - R. Ricciari; E. P. Ferlito; G. Pizzo; M. Padalino; G. Anastasi; M. Sacchi; G. Pappalardo; C. Consalvo; Domenico Mello (Microelectron. Reliab., 2015)