Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. - Laurent Dupont 002; J. L. Blanchard; Richard Lallemand; Gerard Coquery; Jean-Michel Morelle; G. Blondel; B. Rouleau (Microelectron. Reliab., 2010)

Preliminary failure-mode characterization of emerging direct-lead-bonding power module. Comparison with standard wire-bonding interconnection. - William Sanfins; Damien Risaletto; Frédéric Richardeau; G. Blondel; M. Chemin; Philippe Baudesson (Microelectron. Reliab., 2015)