NBTI-aware design of integrated circuits: a hardware-based approach. - Thiago Copetti; G. Cardoso Medeiros; Letícia Maria Bolzani Poehls; Fabian Vargas 001 (LATS, 2015)

Analyzing NBTI impact on SRAMs with resistive-open defects. - M. Tulio Martins; G. Cardoso Medeiros; Thiago Copetti; Fabian Vargas 001; Letícia Maria Bolzani Poehls (LATS, 2016)

Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects. - G. Cardoso Medeiros; Letícia Maria Bolzani Pöhls; Fabian Vargas 001 (VLSID, 2016)

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time. - Thiago Copetti; Guilherme Cardoso Medeiros; Leticia Bolzani Poehls; Fabian Vargas 001 (J. Electron. Test., 2016)

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. - Maksim Jenihhin; Giovanni Squillero; Thiago Santos Copetti; Valentin Tihhomirov; Sergei Kostin; Marco Gaudesi; Fabian Vargas 001; Jaan Raik; Matteo Sonza Reorda; Leticia Bolzani Poehls; Raimund Ubar; Guilherme Cardoso Medeiros (J. Electron. Test., 2016)

Analyzing the behavior of FinFET SRAMs with resistive defects. - Thiago Santos Copetti; Tiago R. Balen; Guilherme Cardoso Medeiros; Letícia Maria Bolzani Poehls (VLSI-SoC, 2017)

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. - Thiago Santos Copetti; Guilherme Cardoso Medeiros; Letícia Maria Bolzani Poehls; Tiago R. Balen (VLSI-SoC (Selected Papers), 2017)

Analysing NBTI Impact on SRAMs with Resistive Defects. - M. Tulio Martins; G. Cardoso Medeiros; Thiago Copetti; Fabian Vargas 001; Marcus Pohls (J. Electron. Test., 2017)

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs. - G. Cardoso Medeiros; E. Brum; Leticia Bolzani Poehls; Thiago Copetti; Tiago R. Balen (LATS, 2018)

A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects. - George Redivo Pinto; Guilherme Cardoso Medeiros; Fabian Vargas 001; Leticia Bolzani Poehls (LATS, 2018)

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. - G. Cardoso Medeiros; Letícia Maria Veiras Bolzani; Mottaqiallah Taouil; Fabian Vargas 001; Said Hamdioui (Microelectron. Reliab., 2018)

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. - Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Moritz Fieback; Leticia Bolzani Poehls; Said Hamdioui (ETS, 2019)

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. - Lizhou Wu; Siddharth Rao; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Erik Jan Marinissen; Farrukh Yasin; Sebastien Couet; Said Hamdioui; Gouri Sankar Kar (ETS, 2019)

Device-Aware Test: A New Test Approach Towards DPPB Level. - Moritz Fieback; Lizhou Wu; Guilherme Cardoso Medeiros; Hassen Aziza; Siddharth Rao; Erik Jan Marinissen; Mottaqiallah Taouil; Said Hamdioui (ITC, 2019)

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects. - G. Cardoso Medeiros; E. Brum; Leticia Bolzani Poehls; Thiago Copetti; Tiago R. Balen (J. Electron. Test., 2019)

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. - Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Lizhou Wu; Moritz Fieback; Maksim Jenihhin; Mottaqiallah Taouil; Said Hamdioui (DATE, 2020)

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Leticia Bolzani Poehls; Tiago R. Balen (LATS, 2020)

Modeling Soft-Error Reliability Under Variability. - Aneesh Balakrishnan; Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Said Hamdioui; Maksim Jenihhin; Dan Alexandrescu (DFT, 2021)

Improving the Detection of Undefined State Faults in FinFET SRAMs. - G. Cardoso Medeiros; Moritz Fieback; Thiago Santos Copetti; Anteneh Gebregiorgis; Mottaqiallah Taouil; Leticia B. Poehls; Said Hamdioui (DTIS, 2021)

Intermittent Undefined State Fault in RRAMs. - Moritz Fieback; Guilherme Cardoso Medeiros; Anteneh Gebregiorgis; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ETS, 2021)

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. - G. Cardoso Medeiros; Moritz Fieback; Anteneh Gebregiorgis; Mottaqiallah Taouil; Leticia Bolzani Poehls; Said Hamdioui (ETS, 2021)

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. - Thiago Copetti; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Letícia Maria Bolzani Poehls; Tiago Roberto Balen (J. Electron. Test., 2021)

Defect and Fault Modeling Framework for STT-MRAM Testing. - Lizhou Wu; Siddharth Rao; Mottaqiallah Taouil; Guilherme Cardoso Medeiros; Moritz Fieback; Erik Jan Marinissen; Gouri Sankar Kar; Said Hamdioui (IEEE Trans. Emerg. Top. Comput., 2021)

Hard-to-Detect Fault Analysis in FinFET SRAMs. - Guilherme Cardoso Medeiros; Moritz Fieback; Lizhou Wu; Mottaqiallah Taouil; Letícia Maria Bolzani Poehls; Said Hamdioui (IEEE Trans. Very Large Scale Integr. Syst., 2021)

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. - Moritz Fieback; Christopher Münch; Anteneh Gebregiorgis; Guilherme Cardoso Medeiros; Mottaqiallah Taouil; Said Hamdioui; Mehdi B. Tahoori (ETS, 2022)

Hierarchical Memory Diagnosis. - Guilherme Cardoso Medeiros; Moritz Fieback; Anteneh Gebregiorgis; Mottaqiallah Taouil; Letícia Maria Veiras Bolzani; Said Hamdioui (ETS, 2022)

Defects, Fault Modeling, and Test Development Framework for RRAMs. - Moritz Fieback; Guilherme Cardoso Medeiros; Lizhou Wu; Hassen Aziza; Rajendra Bishnoi; Mottaqiallah Taouil; Said Hamdioui (ACM J. Emerg. Technol. Comput. Syst., 2022)