Using error tolerance of target application for efficient reliability improvement of digital circuits. - G. G. dos Santos; Elaine Crespo Marques; Lirida A. B. Naviner; Jean-François Naviner (Microelectron. Reliab., 2010)

Exploring the feasibility of selective hardening for combinational logic. - Samuel N. Pagliarini; G. G. dos Santos; Lirida Alves de Barros Naviner; Jean-François Naviner (Microelectron. Reliab., 2012)