Modification of porous ultra-low K dielectric by electron-beam curing. - Cyril Guedj; G. Imbert; E. Martinez; Christophe Licitra; Névine Rochat; V. Arnal (Microelectron. Reliab., 2007)

Investigation Into the Moisture Degradation Mechanism of Integrated Stacks Using New Moisture Sensor Design. - B. Ayoub; G. Imbert; F. Belfis; T. Parrassin; Sébastien Gallois-Garreignot; L. Mischler; Geneviève Duchamp; Hélène Frémont (IRPS, 2025)