Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors. - N. A. Hastas; C. A. Dimitriadis; J. Brini; G. Kamarinos; V. K. Gueorguiev; S. Kaschieva (Microelectron. Reliab., 2003)

Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors. - N. A. Hastas; C. A. Dimitriadis; F. V. Farmakis; G. Kamarinos (Microelectron. Reliab., 2003)

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. - N. A. Hastas; N. Archontas; C. A. Dimitriadis; G. Kamarinos; T. Nikolaidis; N. Georgoulas; Adonios Thanailakis (Microelectron. Reliab., 2005)

Effects of hot carriers in offset gated polysilicon thin-film transistors. - Argyrios T. Hatzopoulos; Dimitrios H. Tassis; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. - Dimitrios H. Tassis; Argyrios T. Hatzopoulos; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. - N. Arpatzanis; Argyrios T. Hatzopoulos; Dimitrios H. Tassis; C. A. Dimitriadis; François Templier; Maher Oudwan; G. Kamarinos (Microelectron. Reliab., 2008)

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors. - N. A. Hastas; N. Arpatzanis; C. A. Dimitriadis; Julien Brochet; François Templier; G. Kamarinos (Microelectron. Reliab., 2011)