Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. - Philippe Soussan; G. Lekens; R. Dreesen; Ward De Ceuninck; Eric Beyne (Microelectron. Reliab., 2003)

Failure mechanisms and qualification testing of passive components. - H. A. Post; P. Letullier; T. Briolat; R. Humke; R. Schuhmann; K. Saarinen; W. Werner; Yves Ousten; G. Lekens; A. Dehbi (Microelectron. Reliab., 2005)

Lifetime modeling of intrinsic gate oxide breakdown at high temperature. - R. Moonen; Piet Vanmeerbeek; G. Lekens; Ward De Ceuninck; Peter Moens; J. Boutsen (Microelectron. Reliab., 2007)