Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. - Benoit Lambert; Nathalie Malbert; Nathalie Labat; Frédéric Verdier; André Touboul; P. Huguet; R. Bonnet; G. Pataut (Microelectron. Reliab., 2001)

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC. - Mohsine Bouya; D. Carisetti; Nathalie Malbert; Nathalie Labat; Philippe Perdu; J. C. Clement; M. Bonnet; G. Pataut (Microelectron. Reliab., 2007)