A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices. - G. Pedreira; Javier Martín-Martínez; Javier Diaz-Fortuny; Pablo Saraza-Canflanca; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Montserrat Nafría (IRPS, 2019)